Electronic system with storage management mechanism and method of operation thereof

ABSTRACT

A method of operation of an electronic system includes: forming a superblock by organizing an erase block according to a wear attribute; detecting a trigger count of the wear attribute of the superblock; updating a metadata table with the trigger count; and triggering a recycling event of the superblock based on the metadata table.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims the benefit of U.S. Provisional PatentApplication Ser. No. 61/529,913 filed Aug. 31, 2011, and the subjectmatter thereof is incorporated herein by reference thereto.

TECHNICAL FIELD

The present invention relates generally to an electronic system and moreparticularly to a system with storage management.

BACKGROUND ART

All electronic systems require some form of memory or storage. Datastorage, often called storage or memory, refers to computer componentsand recording media that retain digital data. Data storage is a corefunction and fundamental component of consumer and industrialelectronics, especially devices such as computers, televisions, cellularphones, mobile devices, and digital video cameras.

Recently, forms of long-term storage other than electromechanical harddisks have become feasible for use in computers. One of these is flashElectrically Erasable Programmable Read-Only Memory (EEPROM). FlashEEPROM memory includes a plurality of floating-gate field effecttransistors arranged as memory cells. NAND flash is one form ofnon-volatile memory used in solid state storage devices. The memorycells are arranged in typical row and column fashion with circuitry foraccessing individual cells. The memory transistors of those cells canstore an analog value that can be interpreted to hold two logical statesfor Single Level Cell (SLC) or more than two logical states as for MultiLevel Cells (MLC).

A flash memory cell, like a typical EEPROM cell but in contrast toDynamic random-access memory (DRAM) memory, retains information whenpower is removed. Flash EEPROM memory has a number of characteristics,which adapt it to use as long-term memory. It is light in weight,occupies very little space, and consumes less power thanelectromechanical disk drives. Construction of a storage system withthis type of memory allows for much higher bandwidth and higher inputoutput operations per second than a typical electromechanical diskdrive. More importantly, it is especially rugged and can operate at amuch high temperature range. It will withstand, without adverse effects,repeated drops, each of which would destroy a typical electromechanicalhard disk drive. A problem exhibited by flash memory is that it tends tohave a limited life in use.

Thus, a need still remains for better storage management to prolong theperformance and durability of electronic systems. In view of theincreasing demand for storage management of electronic systems, it isincreasingly critical that answers be found to these problems. In viewof the ever-increasing commercial competitive pressures, along withgrowing consumer expectations and the diminishing opportunities formeaningful product differentiation in the marketplace, it is criticalthat answers be found for these problems. Additionally, the need toreduce costs, improve efficiencies and performance, and meet competitivepressures adds an even greater urgency to the critical necessity forfinding answers to these problems.

Solutions to these problems have been long sought but prior developmentshave not taught or suggested any solutions and, thus, solutions to theseproblems have long eluded those skilled in the art.

DISCLOSURE OF THE INVENTION

The present invention provides a method of operation of an electronicsystem, including: forming a superblock by organizing an erase blockaccording to a wear attribute; detecting a trigger count of the wearattribute of the superblock; updating a metadata table with the triggercount; and triggering a recycling event of the superblock based on themetadata table.

The present invention provides an electronic system, including: a blockmodule for forming a superblock by organizing an erase block accordingto a wear attribute; a table module, coupled to the block module, fordetecting a trigger count of the wear attribute of the superblock; anupdate module, coupled to the table module, for updating a metadatatable with the trigger count; and a recycle module, coupled to theupdate module, for triggering a recycling event of the superblock basedon the metadata table.

Certain embodiments of the invention have other steps or elements inaddition to or in place of those mentioned above. The steps or elementswill become apparent to those skilled in the art from a reading of thefollowing detailed description when taken with reference to theaccompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is an electronic system with storage management mechanism in anembodiment of the present invention.

FIG. 2 is an exemplary hardware block diagram of the memory controller.

FIG. 3 is an example diagram of the storage management for theelectronic system of FIG. 1.

FIG. 4 is a block diagram of a metadata table of the electronic systemof FIG. 1.

FIG. 5 is a control flow of the memory controller of FIG. 2.

FIG. 6 is a flow chart of a method of operation of the electronic systemof FIG. 1 in a further embodiment of the present invention.

BEST MODE FOR CARRYING OUT THE INVENTION

The following embodiments are described in sufficient detail to enablethose skilled in the art to make and use the invention. It is to beunderstood that other embodiments would be evident based on the presentdisclosure, and that system, process, or mechanical changes may be madewithout departing from the scope of the present invention.

In the following description, numerous specific details are given toprovide a thorough understanding of the invention. However, it will beapparent that the invention may be practiced without these specificdetails. In order to avoid obscuring the present invention, somewell-known circuits, system configurations, and process steps are notdisclosed in detail.

The drawings showing embodiments of the system are semi-diagrammatic andnot to scale and, particularly, some of the dimensions are for theclarity of presentation and are shown exaggerated in the drawing FIGs.Similarly, although the views in the drawings for ease of descriptiongenerally show similar orientations, this depiction in the FIGs. isarbitrary for the most part. Generally, the invention can be operated inany orientation.

Where multiple embodiments are disclosed and described having somefeatures in common, for clarity and ease of illustration, description,and comprehension thereof, similar and like features one to another willordinarily be described with similar reference numerals. The embodimentshave been numbered first embodiment, second embodiment, etc. as a matterof descriptive convenience and are not intended to have any othersignificance or provide limitations for the present invention.

The term “module” referred to herein can include hardware, softwarerunning on or coupled to hardware, or a combination thereof in thepresent invention in accordance with the context in which the term isused. For example, the software can be machine code, firmware, embeddedcode, and application software. Also for example, the hardware can becircuitry, processor, computer, integrated circuit, integrated circuitcores, a microelectromechanical system (MEMS), passive devices,environmental sensors including but not limited to temperature sensors,or a combination thereof.

Referring now to FIG. 1, therein is shown an electronic system 100 withstorage management mechanism in an embodiment of the present invention.The electronic system 100 includes a memory sub-system 102 having amemory controller 104 and a memory array 106. The electronic system 100includes a host system 108 communicating with the memory sub-system 102.

The memory controller 104 provides data control and management of thememory array 106. The memory controller 104 interfaces with the hostsystem 108 and controls the memory array 106 to transfer data betweenthe host system 108 and the memory array 106.

The memory array 106 includes an array of memory devices 110 includingflash memory devices or non-volatile memory devices. The memory array106 can include pages of data or information. The host system 108 canrequest the memory controller 104 for reading, writing, and deletingdata from or to the logical address space of the storage device thatincludes the memory array 106.

The memory devices 110 can include chip selects 112, which are definedas control inputs, for enabling the memory devices 110. Each of the chipselects 112 can be used to control the operation of one of the memorydevices 110. When the chip selects 112 are enabled, the memory devices110 are in active state for operation including reading, writing, orrecycling. This is also true for sub addresses LUNs (logical units)within a device controlled by one chip select.

Referring now to FIG. 2, therein is shown an exemplary hardware blockdiagram of the memory controller 104. The memory controller 104 caninclude a control unit 202, a storage unit 204, a memory interface unit206, and a host interface unit 208. The control unit 202 can include acontrol interface 210. The control unit 202 can execute software 212stored in the storage unit 204 to provide the intelligence of the memorycontroller 104.

The control unit 202 can be implemented in a number of differentmanners. For example, the control unit 202 can be a processor, anembedded processor, a microprocessor, a hardware control logic, ahardware finite state machine (FSM), a digital signal processor (DSP),or a combination thereof.

The control interface 210 can be used for communication between thecontrol unit 202 and other functional units in the memory controller104. The control interface 210 can also be used for communication thatis external to the memory controller 104.

The control interface 210 can receive information from the otherfunctional units or from external sources, or can transmit informationto the other functional units or to external destinations. The externalsources and the external destinations refer to sources and destinationsexternal to the memory controller 104.

The control interface 210 can be implemented in different ways and caninclude different implementations depending on which functional units orexternal units are being interfaced with the control interface 210. Forexample, the control interface 210 can be implemented with dedicatedhardware such is an application-specific integrated circuit (ASIC),configurable hardware such as an FPGA (Field programmable Gate Array),discrete electronic hardware, or a combination thereof.

The storage unit 204 can include hardware, control firmware, and thesoftware 212. The storage unit 204 can contain a volatile memory, anon-volatile memory, an internal memory, an external memory, or acombination thereof. For example, the storage unit 204 can be anon-volatile storage such as non-volatile random access memory (NVRAM),Flash memory, disk storage, or a volatile storage such as static randomaccess memory (SRAM).

The storage unit 204 can include a storage interface 214. The storageinterface 214 can also be used for communication that is external to thememory controller 104. The storage interface 214 can receive informationfrom the other functional units or from external sources, or cantransmit information to the other functional units or to externaldestinations. The external sources and the external destinations referto sources and destinations external to the memory controller 104.

The storage interface 214 can include different implementationsdepending on which functional units or external units are beinginterfaced with the storage unit 204. The storage interface 214 can beimplemented with technologies and techniques similar to theimplementation of the control interface 210.

The memory interface unit 206 can enable external communication to andfrom the memory controller 104. For example, the memory interface unit206 can permit the memory controller 104 to communicate with the memoryarray 106 of FIG. 1.

The memory interface unit 206 can include a memory interface 216. Thememory interface 216 can be used for communication between the memoryinterface unit 206 and other functional units in the memory controller104. The memory interface 216 can receive information from the otherfunctional units or can transmit information to the other functionalunits.

The memory interface 216 can include different implementations dependingon which functional units are being interfaced with the memory interfaceunit 206. The memory interface 216 can be implemented with technologiesand techniques similar to the implementation of the control interface210.

The host interface unit 208 allows the host system 108 of FIG. 1 tointerface and interact with the memory controller 104. The hostinterface unit 208 can include a host interface 218 to providecommunication mechanism between the host interface unit 208 and the hostsystem 108.

The control unit 202 can operate the host interface unit 208 to sendcontrol or status information generated by the memory controller 104 tothe host system 108. The control unit 202 can also execute the software212 for the other functions of the memory controller 104. The controlunit 202 can further execute the software 212 for interaction with thememory array 106 via the memory interface unit 206.

The functional units in the memory controller 104 can work individuallyand independently of the other functional units. For illustrativepurposes, the memory controller 104 is described by operation of thememory controller 104 with the host system 108 and the memory array 106.It is understood that the memory controller 104, the host system 108,and the memory array 106 can operate any of the modules and functions ofthe memory controller 104.

Referring now to FIG. 3, therein is shown an example diagram of thestorage management for the electronic system 100 of FIG. 1. The exampleincludes erase blocks 304 of non-volatile memory in the memory array 106of FIG. 1. The portion of the erase blocks 304 are grouped into asuperblock 302 and the example also includes multiple superblocks.

The superblock 302 is defined as a grouping of some of the erase blocks304. The superblock 302 can be a virtual or logical grouping of theerase blocks 304. The memory controller 104 of FIG. 1 can manage data ona superblock level, instead of an individual erase block level to reducethe volume of information that needs to be tracked to manageable levels.The organization of the superblock 302 can be based on groupings of theerase blocks 304 based on a wear attribute 303. The organization of thesuperblock 302 can be based on age characteristics, use models thatsupport various types of retention strategy, or a combination thereof.The superblock 302 will be explained in further detail below.

The wear attribute 303 is defined as a characteristic of the eraseblocks 304 that degrades the reliability of the erase blocks 304 toretain information. For example, the wear attribute 303 of the eraseblocks 304 can include a read count 305, a write age 306, and a leakage307. The wear attribute 303 can also include an amount of bit errors ofthe erase blocks 304 as another characteristic that degrades thereliability of the erase blocks 304 to retain information.

The read count 305 is a value of a number of reads for one of the eraseblocks 304. The read count 305 indicates the relative age of one of theerase blocks 304. The read count 305 can also be used to indicate therelative retention age or the relative read disturb age for one of theerase blacks 304. The read count 305 can be reset if the erase blocks304 in the superblock 302 are recycled by an erase/write verificationcycle.

The write age 306 refers to the endurance of the erase blocks 304 and isthe number of times the erase blocks 304 has been erased and rewritten.The write age 306 accumulates during the life span of the erase blocks304. The leakage 307 of the erase blocks 304 refers to the retentioncharacteristics of the erase blocks 304 and is the loss of electriccharge over time. The leakage 307 of the erase blocks 304 can be resentafter recycling of the superblock 302.

The electronic system 100 can include a condition table 308. Thecondition table 308 is defined as a record for tracking information andmetadata of the superblock 302 across power cycles. For example, thecondition table 308 can be a record of the wear attribute 303. Thecondition table 308 can be generated before the electronic system 100 ispowered off and the condition table 308 can be stored in non-volatilememory. The condition table 308 can include a trigger count 310. Thecondition table 308 will be explained in further detail below.

The trigger count 310 is defined as a value for one of the erase blocks304 having the highest value for the wear attribute 303 in thesuperblock 302. For example, the trigger count 310 can be the value ofthe read count 305 of one of the erase blocks 304 in the superblock 302with the highest value. The trigger count 310 can also represent thevalue of the erase blocks 304 with the highest value for the write age306 or the leakage 307.

The trigger count 310 is a value that can trigger the recycling of thesuperblock 302. The trigger count 310 can be associated with a value forthe read count 305, the write age 306, and the leakage 307. A singlevalue for the trigger count 310 can represent all of the erase blocks304 within the superblock 302 because recycling occurs on a superblocklevel. If the superblock 302 has undergone an erase/write verify cycle,the trigger count 310 for the read count 305 and the leakage 307 can bereset.

Referring now to FIG. 4, therein is shown a block diagram of a metadatatable 402 of the electronic system 100 of FIG. 1. The metadata table 402is defined as a record including data structures, tables, and indexes ofthe memory array 106 of FIG. 1. The metadata table 402 storesinformation associated with the physical and logical attributes of thememory array 106. For example, the metadata table 402 can include arecord of the wear attribute 303.

The metadata table 402 includes tabling infrastructure and linkages ofmetadata of the superblock 302 of FIG. 3. During operation of theelectronic system 100, the metadata table 402 can be updated by changesmade to the superblock 302 including changes to the wear attribute 303of the erase blocks 304 of FIG. 3. The metadata table 402 can include aprogram erase block index 404 and a block table 406.

The program erase block index 404 is defined as an index for mapping thelogical unit number of blocks to the physical address within thenon-volatile memory structure. The program erase block index 404 can bestored on the storage unit 204 of FIG. 2 and can be modified by thememory controller 104 of FIG. 1.

The program erase block index 404 can include a base pointer 407associated with each of the erase blocks 304 of the non-volatile memory.For example, “base pointer 0” can provide an index for linking a logicalunit number to the physical address of the first of the erase blocks 304in the superblock 302. During recycling, if another one of the eraseblocks 304 is assigned to the superblock 302, the program erase blockindex 404 can be updated with the new physical address of the new spareblock. The program erase block index 404 can include an N number of thebase pointer 407 to index the erase blocks 304.

The block table 406 records information regarding the metadata of theerase blocks 304 of the superblock 302. The block table 406 can alsoinclude the wear attribute 303 of the erase blocks 304 within thesuperblock 302. The block table 406 can also include a valid page countand a logical number for the superblock 302.

The metadata table 402 can be stored on the storage unit 204 and can bemodified by the memory controller 104. During operation of theelectronic system 100, the metadata table 402 can be copied and modifiedin volatile memory, such as random access memory (RAM).

Referring now to FIG. 5, therein is shown a control flow of the memorycontroller 104 of FIG. 2. The memory controller 104 can include a blockmodule 504, a table module 506, an error module 508, a status module512, a condition module 518, an update module 520, a threshold module522, a recycle module 526, and a reset module 530.

In the control flow, as an example, each module is indicated by a numberand successively higher module numbers follow one another. Control flowcan pass from one module to the next higher numbered module unlessexplicitly otherwise indicated. The memory controller 104 can executethe block module 504, the table module 506, the error module 508, thestatus module 512, the condition module 518, the update module 520, thethreshold module 522, the recycle module 526, and the reset module 530.

The block module 504 forms the superblock 302 of FIG. 3 from the eraseblocks 304 of FIG. 3. For example, the superblock 302 can be modifiedand organized after a program/erase verification cycle of recycling.During recycling, the erase blocks 304 having errors caused by the wearattribute 303 of FIG. 3 can be replaced with a spare block from theerase blocks 304.

The superblock 302 can be arranged with the erase blocks 304 havingsimilar characteristics of the wear attribute 303. For example, theerase blocks 304 in the superblock 302 can have a similar value for thewrite age 306 of FIG. 3. Organizing the erase blocks 304 by thesuperblock 302 can maintain a grouping of the erase blocks 304 havingsimilar relative age, endurances, and retention characteristics becausethe erase blocks 304 are written and erased together on a superblocklevel.

For example, one of the erase blocks 304 with the highest value for theread count 305 of FIG. 3 can be the trigger count 310 of FIG. 3 for thesuperblock 302. The trigger count 310 can cause the recycling of thesuperblock 302 with all of the erase blocks 304 in the superblock 302recycled together. Another example includes arranging the erase blocks304 by minimal divergence in bit error rates per page for the superblock302. For example, the erase blocks 304 of the superblock 302 can bearranged by a bit error rate of increments of 25. The erase blocks 304in the superblock 302 can include a bit error rate of 0-25, 26-50, and125-150 as examples. The block module 504 can be coupled to the tablemodule 506 for sharing information.

The table module 506 modifies the metadata table 402 of FIG. 4. Thetable module 506 can modify the metadata table 402 for updating thetabling infrastructure and linkages of changes to the erase blocks 304in the superblock 302. The table module 506 can also identify thetrigger count 310 of the superblock 302 from one of the erase blocks 304with the highest value for the wear attribute 303.

The trigger count 310 can include different values of the read count305, the write age 306, and the leakage 307 of FIG. 3 from differentexamples of the erase blocks 304 of the superblock 302. For example, thetable module 506 can identify one of the erase blocks 304 having thehighest value for the read count 305 and also identify one of the eraseblocks 304 having the highest value for the leakage 307.

The table module 506 can record the trigger count 310 of the superblock302 for the read count 305, the write age 306, and the leakage 307 inthe metadata table 402. The table module 506 can be coupled to theupdate module 520 for updating the metadata table 402 with the triggercount 310.

The metadata table 402 can be copied and modified in volatile memorysuch as RAM. The wear attribute 303 of each of the erase blocks 304 canalso be tracked. The table module 506 can also track metadata on asuperblock level to reduce the volume of information monitored toreduced and more manageable levels. For example, the erase blocks 304are not recycled individually but recycled as the superblock 302. Thetable module 506 can be coupled to the error module 508 and thethreshold module 522 for sharing information.

The error module 508 detects a bit error count 510 in the erase blocks304 in the superblock 302. The bit error count 510 is defined as anamount of bit errors detected from one of the erase blocks 304. Forexample, the error module 508 can detect bit errors in the superblock302 of one or more of the erase blocks 304 as a numerical value for thebit error count 510. The bit error count 510 can include a numberassociated with the bit error rate. If the bit error count 510 for thedata stored on the erase blocks 304 exceeds a tolerable error threshold507, the error module 508 can request recycling of the superblock 302.The wear attribute 303 can include the bit error count 510 as acharacteristic of the erase blocks 304 that degrades reliability inretaining information.

The error module 508 can also detect a program time 511 of the eraseblocks 304. The program time 511 is defined as the amount of time neededto write information to one of the erase blocks 304. If the program time511 exceeds a tolerable time threshold 509, the error module 508 canrequest recycling of the superblock 302. The error module 508 can becoupled to the status module 512 and the threshold module 522.

The status module 512 detects a power up 514 and a power down 516 of theelectronic system 100 of FIG. 1. For example, if the power down 516 ofthe electronic system 100 is detected, the memory controller 104 cansave information and metadata to the condition table 308 of FIG. 3.Further, if the power up 514 is detected, the memory controller 104 canaccess the condition table 308 from non-volatile memory. The statusmodule 512 can be coupled to the table module 506, the error module 508,the condition module 518, and the update module 520 for sharinginformation.

The condition module 518 generates the condition table 308. Thecondition module 518 records the trigger count 310 of the wear attribute303 to the condition table 308 for each of the superblock 302. Thecondition module 518 can save the condition table 308 in non-volatilememory, such as in the storage unit 204 of FIG. 2, an externalnon-volatile memory, or a combination thereof. The condition module 518can be coupled to the update module 520 for sharing information.

The update module 520 updates the metadata table 402. For example,during operation of the electronic system 100, the update module 520 canupdate the metadata table 402 with the trigger count 310 of thesuperblock 302.

The update module 520 can also update the metadata table 402 withinformation from the condition table 308. The update module 520 candetect the power up 514 of the electronic system 100 and update themetadata table 402 with the condition table 308. The condition table 308including the trigger count 310 of the superblock 302 can be copied tothe metadata table 402. The metadata table 402 can be updated with thecondition table 308 instead of detecting the trigger count 310 from eachof the superblock 302 in the memory array 106 of FIG. 1.

The update module 520 can also retrieve the condition table 308 from thenon-volatile memory. The update module 520 can retrieve the conditiontable 308 from the non-volatile memory during the power up 514. Theupdate module 520 can be coupled to the threshold module 522 for sharinginformation.

The threshold module 522 compares the bit error count 510, the programtime 511, or the trigger count 310 with a recycle threshold 524. Therecycle threshold 524 is defined as a minimum value that will trigger anerase/write verify cycle for recycling the superblock 302. The recyclethreshold 524 can be a different value for the bit error count 510, theprogram time 511, and the trigger count 310.

The threshold module 522 can monitor the bit error count 510, theprogram time 511, and the trigger count 310 of the wear attribute 303.If the bit error count 510, the program time 511, or the trigger count310 meet or exceed the recycle threshold 524, the threshold module 522can request recycling of the superblock 302.

For example, the threshold module 522 can detect that the trigger count310 for the superblock 302 that has exceeded the recycle threshold 524.The threshold module 522 can request the recycling of the superblock302. The threshold module 522 can be coupled to the recycle module 526for performing recycling and wear leveling operations.

The recycle module 526 triggers a recycling event 528. The recyclingevent 528 is defined as a data preservation operation for moving anderasing data on the erase blocks 304 of the superblock 302. For example,the recycling event 528 can be used as a wear leveling operation thatrearranges data across the superblock 302 and another of the superblock302. The recycling event 528 is for prolonging the life of the eraseblocks 304 and for ensuring the integrity of data stored on the eraseblocks 304. Data contained in the superblock 302 is copied to another ofthe superblock 302. The superblock 302 having the re-written data resetsthe read count 305 and the leakage 307 of the superblock 302.

The trigger count 310 for relative age and retention characteristics isalso reset because the read count 305 and the leakage 307 of the eraseblocks 304 have been refreshed in another of the superblock 302. Duringthe recycling event 528, the erase blocks 304 with reliability issuessuch as the bit error count 510 and the program time 511 can be replacedwith the erase blocks 304 from spares. The block module 504 can replacethe erase blocks 304 in the superblock 302 with reliability issues withother spares of the erase blocks 304. The recycle module 526 can becoupled to the block module 504 and the reset module 530 for sharinginformation.

The reset module 530 resets the trigger count 310 for the superblock 302in the metadata table 402. The reset module 530 also updates the writeage 306 of the superblock 302 after the recycling event 528. After therecycling event 528, the erase blocks 304 in the superblock 302 will thesame value for the read count 305 and for the leakage 307.

The control flow of the memory controller 104 describes the modulefunctions or order as an example. The modules can be partitioneddifferently. For example, the block module 504, the table module 506,the error module 508, the status module 512, then the condition module518, the update module 520, the threshold module 522, the recycle module526, and the reset module 530 can be implemented as one module or withlesser number of modules. Each of the modules can operate individuallyand independently of the other modules.

The block module 504, the table module 506, the error module 508, thestatus module 512, the condition module 518, the update module 520, thethreshold module 522, the recycle module 526, and the reset module 530can be hardware implementations in the memory controller 104 or can beimplemented as hardware within the electronic system 100 but outside thememory controller 104. The modules of the memory controller 104 can behardware, software running on or coupled to hardware, or a combinationthereof.

It has been discovered that the organization of the superblock 302 bythe wear attribute 303 reduces the volume of information tracked by themetadata table 402 and the condition table 308 to manageable levels. Theerase blocks 304 organized in the superblock 302 can include blockshaving similar relative age, endurance, and retention characteristics.Data management and recycling/wear leveling can occur on the superblocklevel instead of on the erase block level and the memory storagecapacity of the non-volatile memory system can increase withoutincreasing the volume of information that must be tracked.

It has also been discovered that the condition table 308 of thesuperblock 302 reduces the volume of information that needs to betracked to manageable levels across power cycles. The condition table308 can be used to store only the trigger count 310 for the superblock302 because the trigger count 310 can control when the superblock 302undergoes the recycling event 528. During the power down 516, one valuefor the wear attribute 303 can be stored for the superblock 302 insteadof individual values for each of the erase blocks 304.

It has further been discovered that the condition table 308 improvesdata reliability and improves the wear leveling of the non-volatilememory across power cycles. The trigger count 310 of the wear attribute303 can be stored in the condition table 308 at the power down 516.During the power up 514, the metadata table 402 can be synchronized withthe condition table 308 without disturbing the erase blocks 304 withinthe superblock 302. Information from the condition table 308 can becompared with the recycle threshold 524 and the recycling event 528 canbe triggered at initialization of the electronic system 100.

Referring now to FIG. 6, therein is shown a flow chart of a method 600of operation of the electronic system 100 of FIG. 1 in a furtherembodiment of the present invention. The method 600 includes: forming asuperblock by organizing an erase block according to a wear attribute ina block 602; detecting a trigger count of the wear attribute of thesuperblock in a block 604; updating a metadata table with the triggercount in a block 606; and triggering a recycling event of the superblockbased on the metadata table in a block 608.

Thus, it has been discovered that the electronic system 100 of thepresent invention furnishes important and heretofore unknown andunavailable solutions, capabilities, and functional aspects for anelectronic system with read disturb management mechanism. The resultingmethod, process, apparatus, device, product, and/or system isstraightforward, cost-effective, uncomplicated, highly versatile,accurate, sensitive, and effective, and can be implemented by adaptingknown components for ready, efficient, and economical manufacturing,application, and utilization.

Another important aspect of the present invention is that it valuablysupports and services the historical trend of reducing costs,simplifying systems, and increasing performance. These and othervaluable aspects of the present invention consequently further the stateof the technology to at least the next level.

While the invention has been described in conjunction with a specificbest mode, it is to be understood that many alternatives, modifications,and variations will be apparent to those skilled in the art in light ofthe aforegoing description. Accordingly, it is intended to embrace allsuch alternatives, modifications, and variations that fall within thescope of the included claims. All matters hithertofore set forth hereinor shown in the accompanying drawings are to be interpreted in anillustrative and non-limiting sense.

1. A method of operation of an electronic system comprising: forming asuperblock by organizing an erase block according to a wear attribute;detecting a trigger count of the wear attribute of the superblock;updating a metadata table with the trigger count; and triggering arecycling event of the superblock based on the metadata table.
 2. Themethod as claimed in claim 1 wherein detecting the trigger count of thewear attribute includes identifying a read count, a write age, aleakage, or a combination thereof from the erase block of thesuperblock.
 3. The method as claimed in claim 1 further comprisinggenerating a condition table for storing the trigger count during apower down.
 4. The method as claimed in claim 1 wherein triggering therecycling event based on the metadata table includes detecting thetrigger count meeting or exceeding a recycle threshold.
 5. The method asclaimed in claim 1 further comprising: detecting a recycling event; andresetting the trigger count for the superblock based on the recyclingevent.
 6. A method of operation of an electronic system comprising:forming a superblock by organizing an erase block according to a wearattribute; detecting a trigger count of the wear attribute of thesuperblock; updating a metadata table with the trigger count; generatinga condition table for storing the metadata table during a power down;and triggering a recycling event of the superblock based on the metadatatable.
 7. The method as claimed in claim 6 further comprising: detectinga bit error count meeting or exceeding a recycle threshold; and wherein:triggering the recycling event includes triggering the recycling eventbased on the bit error count.
 8. The method as claimed in claim 6further comprising: detecting a program time meeting or exceeding arecycle threshold; and wherein: triggering the recycling event includestriggering the recycling event based on the program time.
 9. The methodas claimed in claim 6 wherein generating the condition table includesrecording the trigger count from the metadata table.
 10. The method asclaimed in claim 6 further comprising: detecting a power up; andupdating the metadata table with the condition table during the powerup.
 11. An electronic system comprising: a block module for forming asuperblock by organizing an erase block according to a wear attribute; atable module, coupled to the block module, for detecting a trigger countof the wear attribute of the superblock; an update module, coupled tothe table module, for updating a metadata table with the trigger count;and a recycle module, coupled to the update module, for triggering arecycling event of the superblock based on the metadata table.
 12. Thesystem as claimed in claim 11 wherein the table module is foridentifying a read count, a write age, a leakage, or a combinationthereof from the erase block in the superblock.
 13. The system asclaimed in claim 11 further comprising a condition module, coupled tothe table module, for generating a condition table for storing thetrigger count during a power down.
 14. The system as claimed in claim 11further comprising a threshold module, coupled to the table module, fordetecting the trigger count meeting or exceeding a recycle threshold.15. The system as claimed in claim 11 further comprising a reset module,coupled to the recycling module, for resetting the trigger count for thesuperblock based on the recycling event.
 16. The system as claimed inclaim 11 further comprising a condition module, coupled to the updatemodule, for generating a condition table for storing the metadata tableduring a power down.
 17. The system as claimed in claim 16 furthercomprising: a threshold module, coupled to table module, for detecting abit error count meeting or exceeding a recycle threshold; and wherein:the recycle module is for triggering the recycling event based on thebit error count.
 18. The system as claimed in claim 16 furthercomprising: a threshold module, coupled to table module, for detecting aprogram time meeting or exceeding a recycle threshold; and wherein: therecycle module is for triggering the recycling event based on theprogram time.
 19. The system as claimed in claim 16 wherein thecondition table is for generating the condition table having the triggercount from the metadata table.
 20. The system as claimed in claim 16further comprising: a status module, coupled to the table module, fordetecting a power up; and wherein: the update module is for updating themetadata table with the condition table during the power up.